SYNTHETIC TEST CIRCUITS FOR SHORT-CIRCUIT TESTING OF HIGH-VOLTAGE ALTERNATING CURRENT CIRCUIT-BREAKERS,AND TRIGGERED SPARK GAPS FOR USE IN SUCH CIRCUITS,申请号GB19920023119-传众专利搜索

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发明名称	SYNTHETIC TEST CIRCUITS FOR SHORT-CIRCUIT TESTING OF HIGH-VOLTAGE ALTERNATING CURRENT CIRCUIT-BREAKERS,AND TRIGGERED SPARK GAPS FOR USE IN SUCH CIRCUITS
摘要
申请公布号	GB9223119(D0)	申请公布日期	1992.12.16
申请号	GB19920023119	申请日期	1992.11.04
申请人	GEC ALSTHOM LIMITED	发明人
分类号	G01R31/02;G01R31/333;H01H33/04;H01H33/59;H01T2/02	主分类号	G01R31/02
代理机构		代理人
主权项
地址

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