Atomic emission spectrometer for simultaneous multi-element measurement of elements in a sample

摘要

An atomic emission spectrometer for multi-element measurement of elements in a sample comprises an apparatus to atomize the sample and to excite the atoms for emitting characteristic spectral lines, a dispersion device which generates a spectrum of the light emitted by the atoms in a focal plane, and a plurality of semiconductor photodetectors, each of which is exposed to one of said characteristic spectral lines. A plurality of semiconductor photodetectors which are exposed to different spectral lines of different intensities of the line spectrum emitted by the atoms of the respective element are utilized so as to achieve a sufficiently large dynamic range for each element to be measured. For measuring each element, an evaluating circuit is arranged to select one semiconductor photodetector for which the intensity of the associated spectral line lies within a part of the measuring range of the semiconductor photodetector which is as favorable as possible.