TESTING CELL TESTING OPEN AND SHORT CIRCUIT OF ELECTRICAL EQUIPMENT CIRCUIT IN NONCONTACT MANNER,申请号JP19900156622-传众专利搜索

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发明名称	TESTING CELL TESTING OPEN AND SHORT CIRCUIT OF ELECTRICAL EQUIPMENT CIRCUIT IN NONCONTACT MANNER
摘要
申请公布号	JPH0337578(A)	申请公布日期	1991.02.18
申请号	JP19900156622	申请日期	1990.06.14
申请人	DIGITAL EQUIP CORP <DEC>	发明人	ANDORIYUU JIEI RAPEIJI;DEIITERUMU JII RINGUREBU
分类号	G01R31/02;G01R31/309	主分类号	G01R31/02
代理机构		代理人
主权项
地址

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