发明名称 FLUORESCENT-X-RAY ANALYZING APPARATUS
摘要 PURPOSE:To broaden the measuring range of elements in a sample and to improve detecting sensitivity and analyzing accuracy, by using an alloy target for an X ray tube, obtaining a specified wavelength by a spectroscopic crystal plate, and thereafter projecting X rays on the sample. CONSTITUTION:An alloy of heavy metal is used as an anode target of an X ray tube 1. The generated primary X rays X1 are inputted to a spectroscopic crystal 3 at an angle theta through a solar slit 2, and only the specified wavelength is reflected. Then the spectroscopic X rays X2 can be set at an arbitrary wavelength by the angle theta. Thus a monochromatic color is formed. Then, the spectroscopic X rays X2, which are made to be the monochromatic color, are projected on a sample 6 through a solar slit 5. Elements in the sample are excited, and the characteristic X rays for each element is generated. Fluorescent X rays X3 are detected by a detector 8. Energy is divided by a system 9, and the qualities and quantities of many elements are determined. In this way, sensitivity is improved, background of the fluorescent X rays X3 become less at the same time, and the detecting limit is improved. Analyzing accuracy is also improved.
申请公布号 JPS6064236(A) 申请公布日期 1985.04.12
申请号 JP19830173384 申请日期 1983.09.20
申请人 SEIKO DENSHI KOGYO KK 发明人 KOMATSU SHIGEMI
分类号 G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/223
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