发明名称 Method for measuring film thickness on wood panels using an IR analyzer
摘要 A method of manufacturing paneling and the like in which the thickness or weight of coatings applied to substrate materials is measured by infrared absorption providing a digital representation, accurate to 0.01 mil, of the coating's thickness or weight to 0.01 gram/sq. ft. The rate of application of the coating is adjusted in accordance with the measurement to maintain the coating weight or thickness within optimum limits.
申请公布号 US4421983(A) 申请公布日期 1983.12.20
申请号 US19810243376 申请日期 1981.03.13
申请人 CHAMPION INTERNATIONAL CORPORATION 发明人 FOGLE, OZZIE;BACK, HARRY E.
分类号 G01N21/35;(IPC1-7):G01J1/00;G05G15/00;B29C23/00 主分类号 G01N21/35
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