发明名称 |
Method for measuring film thickness on wood panels using an IR analyzer |
摘要 |
A method of manufacturing paneling and the like in which the thickness or weight of coatings applied to substrate materials is measured by infrared absorption providing a digital representation, accurate to 0.01 mil, of the coating's thickness or weight to 0.01 gram/sq. ft. The rate of application of the coating is adjusted in accordance with the measurement to maintain the coating weight or thickness within optimum limits. |
申请公布号 |
US4421983(A) |
申请公布日期 |
1983.12.20 |
申请号 |
US19810243376 |
申请日期 |
1981.03.13 |
申请人 |
CHAMPION INTERNATIONAL CORPORATION |
发明人 |
FOGLE, OZZIE;BACK, HARRY E. |
分类号 |
G01N21/35;(IPC1-7):G01J1/00;G05G15/00;B29C23/00 |
主分类号 |
G01N21/35 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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