发明名称 A semiconductor device which prevents soft errors.
摘要 <p>A semiconductor device which prevents soft errors, comprising a diffusion layer formed on a semiconductor substrate and an insulation layer for dividing the diffusion layer into an upper diffusion layer and a lower diffusion layer, a positive voltage being applied to the lower diffusion layer, whereby the electrons of electron-hole pairs generated due to alpha particles are prevented from penetrating into the upper diffusion layer.</p>
申请公布号 EP0083210(A2) 申请公布日期 1983.07.06
申请号 EP19820306891 申请日期 1982.12.23
申请人 FUJITSU LIMITED 发明人 TATEMATSU, TAKEO
分类号 G11C11/401;H01L21/822;H01L21/8242;H01L23/556;H01L27/04;H01L27/10;H01L27/108;H01L29/78;(IPC1-7):01L27/10;01L21/26 主分类号 G11C11/401
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