| 摘要 |
PURPOSE:To simplify function tests by incorporating a MOS dynamic flip-flop shift path in a latch circuit. CONSTITUTION:On the basis of a signal from terminal M, selecting method 51 selects and outputs to memory method 52, providing latch operation, data from data from data input terminal DIN in normal operation mode or from shift-in data input terminal SIN in shift mode. In normal mode, data is outputted from terminal Q and in shift mode, it is outputted from terminal SOVU via dynamic flip-flop shift path 53 composed of MOS transfer gate 3, inverter 1, etc. |
