TEST EQUIPMENT FOR CMOS INTEGRATED CIRCUIT,申请号JP19780046293-传众专利搜索

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发明名称	TEST EQUIPMENT FOR CMOS INTEGRATED CIRCUIT
摘要
申请公布号	JPS54137980(A)	申请公布日期	1979.10.26
申请号	JP19780046293	申请日期	1978.04.18
申请人	MATSUSHITA ELECTRIC IND CO LTD	发明人	TERASAKA KATSUMI;TSUJII YUUZOU
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
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