Integrated circuit comprising a test mode secured by initialization of the test mode

摘要

An electronic circuit, having a test mode in application of the "internal scan path" technique, includes a plurality of configurable cells and a control circuit. The electronic circuit is adapted to working in a standard mode of operation or in a test mode during which the control circuit is active and configures the configurable cells either in a functional state or in a chained state. The electronic circuit furthermore includes a validation circuit that performs the following operations successively when it receives an instruction for changing the mode of operation (TEST, FIN) of the electronic circuit: produce initialization signals (INIT 1 , INIT 2 , . . . , INITN) to command the initialization of all the configurable cells, and then produce a mode-changing signal (VAL).