发明名称 Fluid handling structure, lithographic apparatus and device manufacturing method
摘要 A fluid handling structure for a lithographic apparatus is disclosed. The fluid handling structure has a plurality of openings arranged in plan, in a line. The fluid handling structure is configured such that the openings are directed, in use, towards a facing surface, the facing surface being a substrate and/or a substrate table. The substrate table is configured to support the substrate. Outward of the line of openings is a damper. The damper may have a width that varies along the line of openings. The damper width is defined between the line of openings and an opposing damper edge.
申请公布号 US9383654(B2) 申请公布日期 2016.07.05
申请号 US200912506565 申请日期 2009.07.21
申请人 ASML NETHERLANDS B.V. 发明人 Direcks Daniel Jozef Maria;Donders Sjoerd Nicolaas Lambertus;Kemper Nicolaas Rudolf;Philips Danny Maria Hubertus;Riepen Michel;Van Den Dungen Clemens Johannes Gerardus;Baeten Adrianes Johannes;Evangelista Fabrizio
分类号 G03B27/52;G03F7/20 主分类号 G03B27/52
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A fluid handling structure for a lithographic apparatus, the fluid handling structure having a plurality of openings arranged, in plan, in a line around the center of the fluid handling structure, the fluid handling structure configured such that the openings are directed, in use, towards a facing surface, the facing surface being a substrate and/or a substrate table configured to support the substrate, wherein outward, relative to the center of the fluid handling structure, of the line of openings is a damper, the damper comprising a surface, nearest the facing surface, having a width that varies along the line of openings, the width being defined between the line of openings and an opposing damper edge, and the damper is configured to have a liquid meniscus in contact with the damper surface that strays beyond the line of openings and that extends toward the facing surface.
地址 Veldhoven NL