发明名称 SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME
摘要 A semiconductor structure includes a first III-V compound layer. A second III-V compound layer is over the first III-V compound layer and is different from the first III-V compound layer in composition. A carrier channel is located at an interface of the first III-V compound layer and the second III-V compound layer. Slanted field plates are in an opening in a dielectric layer over the second III-V compound layer; the gate electrode is disposed in the opening.
申请公布号 US2016359035(A1) 申请公布日期 2016.12.08
申请号 US201615242881 申请日期 2016.08.22
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 YU Chen-Ju;HSIUNG Chih-Wen;HSU Chun-Wei;YANG Fu-Chih;YAO Fu-Wei;YU Jiun-Lei Jerry
分类号 H01L29/778;H01L29/49;H01L29/66;H01L29/40;H01L29/20;H01L29/423 主分类号 H01L29/778
代理机构 代理人
主权项 1. A semiconductor device comprising: a first III-V compound layer; a second III-V compound layer over the first III-V compound layer and different from the first III-V compound layer in composition, wherein a carrier channel is located at an interface of the first III-V compound layer and the second III-V compound layer, and wherein the second III-V compound layer has a first composition; an opening in a dielectric layer over the second III-V compound layer, wherein the opening continues through the dielectric layer to extends below a top surface of the second III-V compound layer; slanted field plates in the opening, wherein the slanted field plates interface the first composition; and a gate electrode in the opening and interfacing with the first composition of the second III-V compound layer and the slanted field plates.
地址 Hsin-Chu TW