发明名称 |
SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME |
摘要 |
A semiconductor structure includes a first III-V compound layer. A second III-V compound layer is over the first III-V compound layer and is different from the first III-V compound layer in composition. A carrier channel is located at an interface of the first III-V compound layer and the second III-V compound layer. Slanted field plates are in an opening in a dielectric layer over the second III-V compound layer; the gate electrode is disposed in the opening. |
申请公布号 |
US2016359035(A1) |
申请公布日期 |
2016.12.08 |
申请号 |
US201615242881 |
申请日期 |
2016.08.22 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
YU Chen-Ju;HSIUNG Chih-Wen;HSU Chun-Wei;YANG Fu-Chih;YAO Fu-Wei;YU Jiun-Lei Jerry |
分类号 |
H01L29/778;H01L29/49;H01L29/66;H01L29/40;H01L29/20;H01L29/423 |
主分类号 |
H01L29/778 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a first III-V compound layer; a second III-V compound layer over the first III-V compound layer and different from the first III-V compound layer in composition, wherein a carrier channel is located at an interface of the first III-V compound layer and the second III-V compound layer, and wherein the second III-V compound layer has a first composition; an opening in a dielectric layer over the second III-V compound layer, wherein the opening continues through the dielectric layer to extends below a top surface of the second III-V compound layer; slanted field plates in the opening, wherein the slanted field plates interface the first composition; and a gate electrode in the opening and interfacing with the first composition of the second III-V compound layer and the slanted field plates. |
地址 |
Hsin-Chu TW |