| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus that can easily diagnose operation fail or the like in a semiconductor device after shipment by enabling the self diagnosis of each functional block, for example, the self diagnosis when the power of the semiconductor device is turned on. SOLUTION: There are a BIST controller 20 for transmitting diagnosis conditions to each functional block according to a diagnosis program stored in a memory in advance, a BIST circuit 201 that diagnoses a corresponding functional block based on the diagnosis conditions, acquires a diagnosis result from the corresponding functional block, and transmits the diagnosis result to the BIST controller 20, and a main controller 40 for displaying normality/ abnormality based on the diagnosis result. The diagnosis result obtained in the BIST circuit 201 is transmitted to the main controller 40 via the BIST controller 20, and the normality/abnormality is displayed by the main controller 40.
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