发明名称 |
FLASH MEMORY AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A flash memory is provided to form a floating gate whose edge is sharp and form an insulation layer of a desired thickness on the floating gate, by depositing and selectively etching a sacrificial oxide layer, by depositing and etching a nitride layer so as to form a sidewall and by burying a polycrystalline silicon layer in the sidewall. CONSTITUTION: A floating gate oxide layer(14) is formed in a predetermined region of a semiconductor substrate(11). The floating gate(15') whose upper edge is sharp is formed on the floating gate oxide layer. An insulation layer(16) of a uniform thickness is formed on the semiconductor substrate and the floating gate. A control gate(17') is formed on the insulation layer.
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申请公布号 |
KR20040049874(A) |
申请公布日期 |
2004.06.14 |
申请号 |
KR20020076828 |
申请日期 |
2002.12.05 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
KO, GWAN JU |
分类号 |
H01L29/788;(IPC1-7):H01L29/788 |
主分类号 |
H01L29/788 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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