发明名称 |
PLASMA PROCESSING DEVICE AND METHOD OF MONITORING PLASMA DISCHARGE STATE IN PLASMA PROCESSING DEVICE |
摘要 |
An object is to provide a plasma processing device capable of rightly monitoring existence of plasma discharge and also rightly monitoring existence of abnormal discharge. Another object of the present invention is to provide a method of monitoring a state of plasma discharge in the plasma processing device. A discharge detection sensor (23), in which a dielectric member (21) and a probe electrode unit (22) are combined with each other, is attached to an opening portion (2a) provided in a lid portion (2) composing a vacuum chamber. A change in the electric potential induced in the probe electrode (22b) according to a change in plasma discharge is received, electric potential change wave-forms of specific patterns are respectively detected by an N-type wave-form detecting portion (34) and V- type wave-form detecting (35), and a discharge state judgment including a judgment of whether the electric discharge exists or does not exist and whether the electric discharge is normal or abnormal is made according to a counted value of counting the number of times of appearance of these electric potential change wave-forms for each type of wave-form by a dischargeL0N wave-form counter (36), a discharge OFF wave-form counter (37), an abnormal discharge wave-form counter (38) and a leak discharge wave-form counter (39). |
申请公布号 |
WO2009025392(A3) |
申请公布日期 |
2009.04.16 |
申请号 |
WO2008JP65350 |
申请日期 |
2008.08.20 |
申请人 |
PANASONIC CORPORATION;MIZUKAMI, TATSUHIRO;ARITA, KIYOSHI;NONOMURA, MASARU |
发明人 |
MIZUKAMI, TATSUHIRO;ARITA, KIYOSHI;NONOMURA, MASARU |
分类号 |
H01J37/32 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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