发明名称 EUV multilayer mirror with interlayer and lithographic apparatus using the mirror
摘要 A multilayer mirror to reflect radiation having a wavelength in the range of 2-8 nm has alternating layers. The alternating layers include a first layer and a second layer. The first and second layers are selected from the group consisting of: U and B4C layers, Th and B4C layers, La and B9C layers, La and B4C layers, U and B9C layers, Th and B9C layers, La and B layers, U and B layers, C and B layers, Th and B layers, U compound and B4C layers, Th compound and B4C layers, La compound and B9C layers, La compound and B4C layers, U compound and a B9C layers, Th compound and a B9C layers, La compound and a B layers, U compound and B layers, and Th compound and a B layers. An interlayer is disposed between at least one of the first layers and the second layer.
申请公布号 US9082521(B2) 申请公布日期 2015.07.14
申请号 US201013201242 申请日期 2010.01.11
申请人 ASML NETHERLANDS B.V. 发明人 Glushkov Denis Alexandrovich;Banine Vadim Yevgenyevich;Sjmaenok Leonid Aizikovitch;Salashchenko Nikolay Nikolaevitch;Chkhalo Nikolay Ivanovich
分类号 G02B5/08;G21K1/06;B82Y10/00;B82Y40/00;G03F1/24;G03F7/20 主分类号 G02B5/08
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A multilayer mirror constructed and arranged to reflect radiation having a wavelength in a range of about 6.4 nm-about 7.2 nm, the multilayer mirror having alternating layers, the alternating layers comprising a first layer and a second layer, the first and second layers being selected from the group consisting of: U and B4C layers, Th and B4C layers, U and B9C layers, Th and B9C layers, U and B layers, Th and B layers, U compound and B4C layers, Th compound and B4C layers, U compound and B9C layers, Th compound and B9C layers, U compound and B layers, and Th compound and B layers, wherein at least one of the first layers is separated from a second layer by an interlayer disposed between the at least one of the first layers and the second layer.
地址 Veldhoven NL