发明名称 |
WAFER DICING USING FEMTOSECOND-BASED LASER AND PLASMA ETCHING |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of dicing semiconductor wafers where each wafer is mounted with a plurality of integrated circuits.SOLUTION: A method includes a step of forming a mask on a semiconductor wafer 100. The mask is composed of a layer covering and protecting integrated circuits. The mask is patterned with a femtosecond-based laser scribing process to form a patterned mask with gaps. By patterning, regions 102 between the integrated circuits of the semiconductor wafer is exposed. The semiconductor wafer is then etched through the gaps in the patterned mask to dice the integrated circuits. |
申请公布号 |
JP2015109450(A) |
申请公布日期 |
2015.06.11 |
申请号 |
JP20140257046 |
申请日期 |
2014.12.19 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
LEI WEI-SHENG;BRAD EATON;MADHAVA RAO YALAMANCHILI;SARAVJEET SINGH;AJAY KUMAR;JAMES M HOLDEN |
分类号 |
H01L21/301;B23K26/00;B23K26/364;H01L21/302;H01L21/3065 |
主分类号 |
H01L21/301 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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