SAMPLE ANALYSIS DEVICE, TESTING APPARATUS, AND SENSOR CARTRIDGE

摘要

A sample analysis device capable of realizing the enhancement of a near-field light while increasing a hotspot areal density is provided. In a sample analysis device, multiple nanostructures are arranged on the surface of a base body. A dielectric body is covered with a metal film in each nanostructure. The nanostructures form multiple nanostructure lines. In each nanostructure line, the nanostructures are arranged at a first pitch SP which is smaller than the wavelength of an excitation light and the nanostructure lines are arranged in parallel with one another at a second pitch LP which is greater than the first pitch SP.

主权项

1. A sample analysis device, comprising:
a base body; and multiple nanostructures, which are arranged on the surface of the base body, and each of which has a dielectric body covered with a metal film, wherein the nanostructures form multiple nanostructure lines, and in each nanostructure line, the nanostructures are arranged in a first direction at a first pitch which is smaller than the wavelength of an excitation light, and the nanostructure lines are arranged in a second direction intersecting the first direction at a second pitch which is greater than the first pitch.