发明名称 |
Semiconductor integrated circuit |
摘要 |
A semiconductor integrated circuit includes a substrate, a multi-gate transistor device formed on the substrate, and an n-well resistor formed in the substrate. The substrate includes a plurality of first isolation structures and at least a second isolation structure formed therein. A depth of the first isolation structures is smaller than a depth of the second isolation structure. The multi-gate transistor device includes a plurality of fin structures, and the fin structures are parallel with each other and spaced apart from each other by the first isolation structures. The n-well resistor includes at least one first isolation structure. The n-well resistor and the multi-gate transistor device are electrically isolated from each other by the second isolation structure. |
申请公布号 |
US9035425(B2) |
申请公布日期 |
2015.05.19 |
申请号 |
US201313875291 |
申请日期 |
2013.05.02 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Tsao Po-Chao |
分类号 |
H01L29/00;H01L27/088;H01L27/06;H01L21/8234;H01L21/70 |
主分类号 |
H01L29/00 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A semiconductor integrated circuit comprising:
a substrate having a plurality of first isolation structures and at least a second isolation structure formed therein, and a depth of the first isolation structures being smaller than a depth of the second isolation structure; a multi-gate transistor device formed on the substrate, the multi-gate transistor device comprising a plurality of fin structures, and the fin structures being parallel with each other and spaced apart from each other by the first isolation structures; and an n-well resistor formed in the substrate, the n-well resistor comprising at least one first isolation structure and two fin terminals positioned at respective two ends of the first isolation structure, and the n-well resistor being electrically isolated from the multi-gate transistor device by the second isolation structure. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |