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发明名称
测量仪器线镭射测头校准系统及方法;System and Method for Adjusting Line Laser Probes of Measurement Machine
摘要
一种测量仪器线镭射测头校准系统,包括:第一测量模组,用于获取第一线镭射测头和第二线镭射测头测得第一标准件的轮廓资料;第一计算模组,用于计算第一线镭射测头和第二线镭射测头之间的倾角值;第二测量模组,用于获取第一线镭射测头和第二线镭射测头测量第二标准件的轮廓资料;第二计算模组,用于计算第一线镭射测头和第二线镭射测头的位差值和间距值;获取模组,用于根据倾角值、位差值及间距值校准第二线镭射测头测量第一标准件的轮廓资料得到测量值;第三计算模组,用于根据第一标准件的测量值与标准值计算精度补偿值。
申请公布号
TW201514441
申请公布日期
2015.04.16
申请号
TW102131124
申请日期
2013.08.29
申请人
鸿海精密工业股份有限公司 HON HAI PRECISION INDUSTRY CO., LTD.
发明人
张滋 ZHANG, ZI;徐韦 XU, WEI;陈斌 CHEN, BIN;屈保锋 QU, BAO-FENG
分类号
G01B11/00(2006.01);G01B11/24(2006.01)
主分类号
G01B11/00(2006.01)
代理机构
代理人
主权项
地址
新北市土城区自由街2号 TW
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