发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which is thin and has high reliability without deteriorating adhesion when connecting a semiconductor element and a base material, or connecting semiconductor elements with each other.SOLUTION: A semiconductor device manufacturing method comprises: a die bonding process of sequentially adhering each semiconductor element 1SA to a base material on a heated stage or to a predetermined position of a semiconductor element 10 in a lower stage; a process of connecting a terminal formed in an opening of the semiconductor element 10 and a terminal 13 formed on the base material by a bonding wire; and a process of encapsulating the semiconductor element 10 and the bonding wire. The die bonding process is a process of adhering each semiconductor element to the base material or to the predetermined position of the semiconductor element in the lower stage by using a semi-cured adhesive, a semi-cured film or a liquid adhesive (B-stage adhesive) 12. |
申请公布号 |
JP2014187167(A) |
申请公布日期 |
2014.10.02 |
申请号 |
JP20130060693 |
申请日期 |
2013.03.22 |
申请人 |
TOSHIBA CORP |
发明人 |
YOSHIMURA ATSUSHI;MATSUSHIMA RYOJI |
分类号 |
H01L25/065;H01L21/301;H01L21/50;H01L21/52;H01L25/07;H01L25/18 |
主分类号 |
H01L25/065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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