发明名称 RESOLUTION PROGRAMMABLE DYNAMIC IR-DROP SENSOR WITH PEAK IR-DROP TRACKING ABILITIES
摘要 A data processing system on an integrated circuit includes a core that performs switching operations responsive to a system clock that draws current from the power supply network. An IR-drop detector includes a resistor ladder having outputs representative of an IR-drop caused by the core during the switching operations. The system further includes a plurality of amplifiers coupled to the outputs indicative of the IR-drop, a plurality of flip-flops coupled to the amplifiers, and a variable clock generator. The variable clock generator outputs a sampling clock comprising a group consisting of a variable phase or a variable frequency to the plurality of flip-flops. The flip-flops are triggered by the sampling clock so that the IR-drop at a time during a clock cycle of the system clock can be detected, and the peak IR-drop value for can be tracked.
申请公布号 US2014281642(A1) 申请公布日期 2014.09.18
申请号 US201313798715 申请日期 2013.03.13
申请人 WANG XIAOXIAO;AHMED NISAR;JARRAR ANIS M.;TRAN DAT T.;WINEMBERG LEROY 发明人 WANG XIAOXIAO;AHMED NISAR;JARRAR ANIS M.;TRAN DAT T.;WINEMBERG LEROY
分类号 G06F1/26 主分类号 G06F1/26
代理机构 代理人
主权项 1. A data processing system on an integrated circuit, comprising: a core, coupled to a power supply network that performs switching operations responsive to a system clock that draws current from the power supply network; and an IR-drop detector, comprising: a resistor ladder, coupled to the power supply network, having a plurality of outputs representative of an IR-drop caused by the core during the switching operations;a plurality of amplifiers, coupled to the plurality of outputs;a plurality of flip-flops coupled to the plurality of outputs of the plurality of amplifiers; anda variable clock generator that outputs a sampling clock comprising a first feature of a group consisting of a variable phase or a variable frequency to the plurality of flip-flops, wherein the plurality of flip-flops are triggered by the sampling clock so that the IR-drop at a sampling time can be detected.
地址 Austin TX US