发明名称 TEST APPARATUS
摘要 A test apparatus for a server includes a first connection unit coupled to a mother board of the server, a second connection unit coupled to a device under test, a data transmission unit, a processing unit, and a network unit. According to a selection signal, the data transmission unit switches one of data transmission modes to perform data transmission between the first connection unit and the second connection unit. The processing unit controls the data transmission unit to perform a first test program for the mother board through the first connection unit, or perform a second test program for the device under test through the first connection unit and the second connection unit. The network unit receives a control signal generated by an external apparatus, so that the external apparatus controls the processing unit to perform the first test program and the second test program through the network unit.
申请公布号 US2014122938(A1) 申请公布日期 2014.05.01
申请号 US201313785245 申请日期 2013.03.05
申请人 INVENTEC (PUDONG) TECHNOLOGY CORPORATION;INVENTEC CORPORATION 发明人 CHIN CHIH-JEN;LU YU-SHU
分类号 G06F11/273 主分类号 G06F11/273
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