发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
There is provided a semiconductor device having a High Electron Mobility Transistor (HEMT) structure allowing for enhanced performance and a method of manufacturing the same. The semiconductor device includes a base substrate; a semiconductor layer provided on the base substrate; a source electrode, a gate electrode and a drain electrode provided on the semiconductor layer to be spaced apart from one another; and an ohmic-contact layer partially provided at an interface between the drain electrode and the semiconductor layer. |
申请公布号 |
US8637902(B2) |
申请公布日期 |
2014.01.28 |
申请号 |
US20100907653 |
申请日期 |
2010.10.19 |
申请人 |
PARK KI YEOL;JEON WOO CHUL;PARK YOUNG HWAN;LEE JUNG HEE;SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
PARK KI YEOL;JEON WOO CHUL;PARK YOUNG HWAN;LEE JUNG HEE |
分类号 |
H01L29/737;H01L29/778 |
主分类号 |
H01L29/737 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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