发明名称 Semiconductor device and method of manufacturing the same
摘要 There is provided a semiconductor device having a High Electron Mobility Transistor (HEMT) structure allowing for enhanced performance and a method of manufacturing the same. The semiconductor device includes a base substrate; a semiconductor layer provided on the base substrate; a source electrode, a gate electrode and a drain electrode provided on the semiconductor layer to be spaced apart from one another; and an ohmic-contact layer partially provided at an interface between the drain electrode and the semiconductor layer.
申请公布号 US8637902(B2) 申请公布日期 2014.01.28
申请号 US20100907653 申请日期 2010.10.19
申请人 PARK KI YEOL;JEON WOO CHUL;PARK YOUNG HWAN;LEE JUNG HEE;SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 PARK KI YEOL;JEON WOO CHUL;PARK YOUNG HWAN;LEE JUNG HEE
分类号 H01L29/737;H01L29/778 主分类号 H01L29/737
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