发明名称 TESTING APPARATUS FOR INPUT DEVICE
摘要 A testing apparatus for testing an input device of an electronic device includes a testing stage, a bracket, a testing device, and a driving system. The testing stage receives the electronic device. The testing device is slidably mounted to the bracket. The testing device including a first touching member. The driving system drives the testing device to move in an X-axis, a Y-axis, and a Z-axis, such that the touching member rolls and presses on the input device. Each two of the X-axis, the Y-axis, and the Z-axis are perpendicular to each other.
申请公布号 US2013152711(A1) 申请公布日期 2013.06.20
申请号 US201213594856 申请日期 2012.08.26
申请人 XU MING-MING;WANG XIAO-WEI;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD. 发明人 XU MING-MING;WANG XIAO-WEI
分类号 G01N19/00 主分类号 G01N19/00
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