发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH BURIED GATE
摘要 <p>PURPOSE: A method for manufacturing a semiconductor device with a buried gate is provided to improve the productivity of the semiconductor device by omitting a planarization process for removing a protrusion. CONSTITUTION: An open area(38) is formed by selectively etching an insulation layer(36). A plug conductive layer(39B) is formed to bury a contact hole(37) in a substrate(31). The plug conductive layer and the insulation layer are etched by using a peri open mask. A peri gate conductive layer(40A) is formed on the substrate. A plug is formed by etching the peri gate conductive layer and the plug conductive layer using a cell open mask.</p>
申请公布号 KR20110078132(A) 申请公布日期 2011.07.07
申请号 KR20090134869 申请日期 2009.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIM, SEUNG HYUN
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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