发明名称 PLASMA TREATING APPARATUS
摘要 PROBLEM TO BE SOLVED: To improve removal efficiency of a deposit at an edge in a substrate placement electrode in etching equipment for treating a substrate by applying a high-voltage high frequency to the substrate placement electrode and using treatment conditions of strong deposit properties. SOLUTION: Plasma etching equipment includes a lower electrode that places a substrate to be treated in a vacuum treatment vessel and includes a means of applying high-frequency power, an upper electrode that is disposed at a position opposing the lower electrode and includes a means of applying high-frequency power, a gas introduction mechanism for introducing gas used for plasma treatment, and an evacuation mechanism capable of keeping the inside of the vacuum treatment vessel at a desired pressure. In the plasma etching equipment, a conductor line is formed at an electrode edge section outside the lower electrode, power is supplied to the conductor line in plasma cleaning, and the electrode edge section is heated, thus improving efficiency of plasma cleaning. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011034994(A) 申请公布日期 2011.02.17
申请号 JP20090176776 申请日期 2009.07.29
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 TAMURA SATOYUKI;SHIRAYONE SHIGERU
分类号 H01L21/3065 主分类号 H01L21/3065
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