发明名称 IMPROVEMENT OF SOLDER INTERCONNECT BY ADDITION OF COPPER
摘要 PURPOSE: An improvement of a solder interconnect by adding copper, which forms an IMC section between a solder bump and a bump pad, is provided to reduce bump malfunction and to improve the mechanical property of a joint between the bump and pad. CONSTITUTION: An improvement of a solder interconnect by adding copper comprises next steps. An electronic device(100) and a substrate(120) are offered. A copper - layer of inclusion is formed on a nickel - layer of inclusion before a reflow process is applied to an electronic device. A solder bump pad(130) is installed on the substrate.
申请公布号 KR20110006615(A) 申请公布日期 2011.01.20
申请号 KR20100066127 申请日期 2010.07.09
申请人 LSI CORPORATION 发明人 BACHMAN MARK A.;OSENBACH JOHN W.;DESAI KISHOR V.
分类号 B23K35/14;B23K35/22;B23K35/30;H01L21/60 主分类号 B23K35/14
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