发明名称 |
IMPROVEMENT OF SOLDER INTERCONNECT BY ADDITION OF COPPER |
摘要 |
PURPOSE: An improvement of a solder interconnect by adding copper, which forms an IMC section between a solder bump and a bump pad, is provided to reduce bump malfunction and to improve the mechanical property of a joint between the bump and pad. CONSTITUTION: An improvement of a solder interconnect by adding copper comprises next steps. An electronic device(100) and a substrate(120) are offered. A copper - layer of inclusion is formed on a nickel - layer of inclusion before a reflow process is applied to an electronic device. A solder bump pad(130) is installed on the substrate. |
申请公布号 |
KR20110006615(A) |
申请公布日期 |
2011.01.20 |
申请号 |
KR20100066127 |
申请日期 |
2010.07.09 |
申请人 |
LSI CORPORATION |
发明人 |
BACHMAN MARK A.;OSENBACH JOHN W.;DESAI KISHOR V. |
分类号 |
B23K35/14;B23K35/22;B23K35/30;H01L21/60 |
主分类号 |
B23K35/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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