发明名称 |
SYSTEM FOR MEASURING PHYSICAL PROPERTY VALUE OF GAS, METHOD FOR MEASURING PHYSICAL PROPERTY VALUE OF GAS, SYSTEM FOR FORMING HEATING VALUE CALCULATION EXPRESSION, METHOD FOR FORMING HEATING VALUE CALCULATION EXPRESSION, SYSTEM FOR CALCULATING HEATING VALUE AND METHOD FOR CALCULATING HEATING VALUE |
摘要 |
PROBLEM TO BE SOLVED: To provide a device capable of stably measuring a physical property value of a gas. SOLUTION: A system for measuring the physical property value of the gas includes: a microchip 8A having a heating resistor; a driving circuit 303 supplying a plurality of different powers to the heating resistor of the microchip 8A and making the microchip 8A generate heat at a plurality of different heating temperatures; and a heat radiation coefficient calculation module 301 for calculating a heat radiation coefficient of a gas based on the values of the plurality of powers, the values of the plurality of heating temperature, and the gas temperature of the gas thermally equilibrated with the heating resistor. The supply of power to the heating resistor is stopped at least once while the driving circuit 303 makes the heating resistor generate heat at the plurality of different heating temperatures. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010210555(A) |
申请公布日期 |
2010.09.24 |
申请号 |
JP20090059175 |
申请日期 |
2009.03.12 |
申请人 |
YAMATAKE CORP |
发明人 |
OISHI YASUHARU;HAYASHI YASUE;MUTO HIROYUKI;KIYOTA MISAKO;MORIO SHUJI |
分类号 |
G01N25/18;G01N33/22 |
主分类号 |
G01N25/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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