发明名称 |
Resist composition containing a sulfonium compound, pattern-forming method using the resist composition, and sulfonium compound |
摘要 |
A resist composition includes (A) a compound represented by the following formula (I): wherein each of R 1 to R 13 independently represents a hydrogen atom or a substituent, provided that at least one of R 1 to R 13 is a substituent containing an alcoholic hydroxyl group; Z represents a single bond or a divalent linking group; and X - represents an anion containing a proton acceptor functional group. |
申请公布号 |
EP2020617(A3) |
申请公布日期 |
2009.04.29 |
申请号 |
EP20080013861 |
申请日期 |
2008.08.01 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
KAMINURA, SOU;KAWANISHI, YASUTOMO;WADA, KENJI;TSUCHIMURA, TOMOTAKA |
分类号 |
G03F7/004;G03F7/039 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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