发明名称 DEVICE AND METHOD FOR MATERIAL DISCRIMINATION AND INSPECTION
摘要 PROBLEM TO BE SOLVED: To provide a device for, material discrimination and inspection capable of discriminating the material of an inspection target in a short time, by continuously inspecting the inspection target and unnecessary for preliminarily calculating the characteristic data of the detection output of X rays and the thickness of the inspection target, and to provide a material discrimination and inspection method. SOLUTION: The material discrimination and inspection device is equipped with a feed device 12 for feeding the inspection target 5, an X-ray irradiating device 14 for irradiating the inspection target with incident X rays 7, having a predetermined energy distributing within the same cross section crossing a feed direction at right angles, from at least two different directions at the same time or so as to shift the time; an X-ray detector 16 for discriminating the intensities of the X rays of at least two energy regions from the transmitted X rays 8 transmitted through the inspection target, on which incident X rays are irradiated, to measure the same; and an arithmetic device 18 for calculating the effective atomic number Z<SB>eff</SB>and electron densityρ<SB>e</SB>of the inspection target from the intensities of the incident X rays and the transmitted X rays at least in two energy regions and discriminating the material of the inspection target from them. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009053090(A) 申请公布日期 2009.03.12
申请号 JP20070221138 申请日期 2007.08.28
申请人 IHI CORP;NATIONAL UNIV CORP SHIZUOKA UNIV 发明人 ISHIDA ONORI;KANEKO NAMIO;AOKI TORU
分类号 G01N23/04 主分类号 G01N23/04
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