发明名称 Method and apparatus for detecting atomic particles
摘要 An atomic particle detection assembly includes at least one atomic particle detector positioned within a first chamber having a first operating pressure. The assembly also includes at least one junction apparatus coupled to the at least one atomic particle detector. The at least one junction apparatus includes at least one wall that at least partially defines a second chamber having a second operating pressure. The second pressure is greater than the first pressure and the at least one junction apparatus facilitates maintaining a predetermined pressure difference between the first chamber and the second chamber.
申请公布号 US7335890(B2) 申请公布日期 2008.02.26
申请号 US20060425789 申请日期 2006.06.22
申请人 GENERAL ELECTRIC COMPANY 发明人 UTTERBACK KARI
分类号 G01T3/00 主分类号 G01T3/00
代理机构 代理人
主权项
地址