Verfahren zur Ermittlung makroskopischer Einschlüsse in Metallen,申请号DE200550001349T-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Verfahren zur Ermittlung makroskopischer Einschlüsse in Metallen
摘要
申请公布号	DE502005001349(D1)	申请公布日期	2007.10.11
申请号	DE200550001349T	申请日期	2005.05.11
申请人	SALZGITTER MANNESMANN GMBH	发明人	WEINBERG, MATTHIAS DR.
分类号	G01N33/20;G01N21/892	主分类号	G01N33/20
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Methods of forming semiconductor devices and FinFET devices, and FinFET devices

Semiconductor device with transistor local interconnects

Semiconductor pillar transistors having channels with different crystal orientations

Method of fabricating semiconductor apparatus with through-silicon via and method of fabricating stack package including the semiconductor chip

Apparatuses, systems and methods for cleaning photovoltaic devices

Method for increasing adhesion of copper to polymeric surfaces

Sub-saturated atomic layer deposition and conformal film deposition

Oxide TFT and manufacturing method thereof

Methods of forming and using materials containing silicon and nitrogen

Ionization vacuum gauge

Internal insulation design using porous material for an electrochemical cell

Nano particle/polyamide composite material, preparation method therefor, and use thereof

Ceramic electronic component and method for manufacturing ceramic electronic component

Category 8 cable

Helical tensioner for tension members

Non-volatile memory device

Gapless pattern detection circuit and semiconductor device including the same

Thumbnail generation and presentation for recorded TV programs

MPEG objects and systems and methods for using MPEG objects

System and method for combining a song and non-song musical content