| 摘要 |
A test device for testing a device under test, wherein the test device is adapted for providing a connection to a central controller, the test device comprising a first interface for receiving a test procedure activation signal from the central controller, and a processor for performing a test procedure on the basis of a test procedure data upon receipt of the test procedure activation signal, wherein the processor is capable of adjusting the test procedure upon receipt of a feedback signal from the device under test.
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