发明名称 Transistor having fully-depleted junctions to reduce capacitance and increase radiation immunity in an integrated circuit
摘要 A floating-gate transistor for an integrated circuit is formed on a p-type substrate. An n-type region is disposed over the p-type substrate. A p-type region is disposed over the n-type region. Spaced apart n-type source and drain regions are disposed in the p-type region forming a channel therein. A floating gate is disposed above and insulated from the channel. A control gate is disposed above and insulated from the floating gate. An isolation trench disposed in the p-type region and surrounding the source and drain regions, the isolation trench extending down into the n-type region. The substrate, the n-type region and the p-type region each biased such that the p-type region is fully depleted.
申请公布号 US7119393(B1) 申请公布日期 2006.10.10
申请号 US20030629337 申请日期 2003.07.28
申请人 ACTEL CORPORATION 发明人 MCCOLLUM JOHN
分类号 H01L29/788;H01L29/76;H01L29/792 主分类号 H01L29/788
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