发明名称 Physical parameter measuring apparatus and method thereof
摘要 A method and system (22) are provided to measure a physical parameter of a layer (30) of a multi layer article in which first and second pulse of electromagnetic energy are directed to the surface of the article, the first pulse causing ultrasonic motion of a first spot on the surface and the second pulse directed to a second spot which substantially overlaps the first spot being reflected and modulated by Doppler shifting due to the ultrasonic motion of the surface. The reflected pulse is detected to obtain a corresponding ultrasonic electric signal which is processed to obtain a physical parameter of the at least one layer at the overlapping spots.
申请公布号 EP1679513(A2) 申请公布日期 2006.07.12
申请号 EP20060003540 申请日期 1997.11.21
申请人 PERCEPTRON, INC. 发明人 DIXON, JOHN W.;LAPLANT, FREDERICK P.;WHITE, JEFFREY S.
分类号 G01N29/24;G01N21/17 主分类号 G01N29/24
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