发明名称 SEMICONDUCTOR APPARATUS AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To inhibit the curvature and the crack of a substrate at the time of laser annealing to a whole substrate surface which performs a laser irradiation. SOLUTION: A method of manufacturing a semiconductor apparatus having a plurality of chip regions 2 in which a semiconductor chip is formed on a substrate 1 includes the step of forming a groove 3 having a depth of 10μm to 20μm in the substrate 1 between the plurality of the chip regions 2. After the groove 3 is formed, the laser annealing is performed by irradiating the whole surface of the substrate 1 with the laser beam 14. The width of the groove 3 is the value expressed by l×ΔT×η(l represents the length of the chip region,ΔT represents a temperature difference of the front surface and the rear surface of the substrate at the time of laser annealing, andηrepresents a line coefficient of thermal expansion of the substrate.). COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006140176(A) 申请公布日期 2006.06.01
申请号 JP20040325951 申请日期 2004.11.10
申请人 RENESAS TECHNOLOGY CORP 发明人 FUJINAGA MASATO
分类号 H01L21/268;H01L21/02;H01L21/22;H01L21/265;H01L21/324 主分类号 H01L21/268
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