| 摘要 |
In a method of measuring group delay (T<SUB>gd</SUB>) of a device under test, an analog input signal having a predetermined period (T) is provided to the device under test so as to obtain a delayed output signal from the device under test. A phase difference is detected between first and second digital signals converted from the analog input signal and the delayed output signal, respectively. A current (I) corresponding to the phase difference flows through a circuit having a predetermined resistance (R) so as to result in a potential difference (DeltaV). As such, the group delay (T<SUB>gd</SUB>) of the device under test is determined as a function of the predetermined period (T), the current (I), the predetermined resistance (R), and the potential difference (DeltaV). An apparatus for measuring the group delay (T<SUB>gd</SUB>) of the device under test is also disclosed.
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