发明名称 Scanning electron microscope having multiple detectors and a method for multiple detector based imaging
摘要 A system and method for multi detector detection of electrons, the method includes the steps of directing a primary electron beam, through a column, to interact with an inspected object, directing, by introducing a substantial electrostatic field, electrons reflected or scattered from the inspected objects towards multiple interior detectors, whereas at least some of the directed electrons are reflected or scattered at small angle in relation to the inspected object; and receiving detection signals from at least one interior detector.
申请公布号 US2006054814(A1) 申请公布日期 2006.03.16
申请号 US20050502104 申请日期 2005.09.19
申请人 SHEMESH DROR;ADAMEC PAVEL 发明人 SHEMESH DROR;ADAMEC PAVEL
分类号 G21K7/00;G01N23/225;H01J37/244;H01J37/28 主分类号 G21K7/00
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