发明名称 High performance, integrated, MOS-type semiconductor device and related manufacturing process
摘要 An LDMOS device includes elementary MOS cells. The gate structure of the elementary cell includes a first conductor material finger. The LDMOS device includes first metal stripes for contacting source regions, second metal stripes for contacting drain regions, and third metal stripes placed on inactive zones for contacting a material finger by forming a contact point. The contact point is formed by a first prolongation of the material finger for connecting with one of the third stripes. The third metal stripe includes at least one fourth metal stripe placed on a separation zone. The material finger has a second prolongation and the fourth metal stripe has a first prolongation to form an additional contact point.
申请公布号 US6933563(B2) 申请公布日期 2005.08.23
申请号 US20030677108 申请日期 2003.09.30
申请人 STMICROELECTRONICS S.R.L. 发明人 SCHILLACI ANTONINO;PONZIO PAOLA
分类号 H01L29/06;H01L29/417;H01L29/423;H01L29/78;(IPC1-7):H01L257/343 主分类号 H01L29/06
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