发明名称 |
Apparatus for measurement of the thickness of thin layers |
摘要 |
Device for measuring the thickness of thin films using X-ray fluoroscopy has an X-ray tube and a diaphragm device (17) placed between it and a layer to be measured. The diaphragm device comprises an X-ray absorbing zone (26) and an opening (28). The geometry of the opening is such that it is at least partially matched to the geometry of the layer to be measured. |
申请公布号 |
GB0328815(D0) |
申请公布日期 |
2004.01.14 |
申请号 |
GB20030028815 |
申请日期 |
2003.12.11 |
申请人 |
IMMOBILIENGESELLSCHAFT HELMUT FISCHER GMBH & CO.KG |
发明人 |
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分类号 |
G01B15/02;G01N23/223;G21K1/02;G21K5/02 |
主分类号 |
G01B15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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