发明名称 METHOD OF MANUFACTURING RESIN-SEALED SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a resin-sealed semiconductor device, which is capable of surely and stably forming a low loop of a bonding wire when a semiconductor element and an inner lead are electrically connected together with a bonding wire. <P>SOLUTION: In the method for manufacturing the resin-sealed semiconductor device, a semiconductor element 2 and an inner lead 1 to be electrically connected to an external terminal are electrically connected together with a bonding wire 3. The method comprises an electrical conduction step ST1 of keeping a first surface 20 of the semiconductor element 2 where the bonding wire 3 is bonded first at a first support level 60 higher than a second surface 30 of the inner lead 1 and of electrically connecting the semiconductor element 2 and the inner lead 1 together with the bonding wire 3, and a sealing step ST2 of keeping the semiconductor element 2 at a second support level 65 lower than the first support level 60 and of sealing up the semiconductor element 2 with resin. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003218145(A) 申请公布日期 2003.07.31
申请号 JP20020010669 申请日期 2002.01.18
申请人 SONY CORP 发明人 HIGASHIHARA KIYOSHI
分类号 H01L21/60;H01L21/56;H01L23/50 主分类号 H01L21/60
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