发明名称 POLISHING COMPOSITION AND POLISHING METHOD USING THE SAME
摘要 PURPOSE: To provide a polishing composition which can polish a tungsten film and an insulating film at a substantially same polishing rate; and as a result, create a polishing surface on which no polishing scratches occur with proper flatness, and which is not contaminated with impurities, such as iron ions or the like. CONSTITUTION: In a polishing composition for polishing a semiconductor device, and a polishing method using the same, the semiconductor device is composed of at least a tungsten film and an insulating film which contain (a) silicon dioxide, (b) periodic acid, and (c) a pH adjuster. This polishing composition is suited to finishing polishing of the semiconductor device.
申请公布号 KR20030014614(A) 申请公布日期 2003.02.19
申请号 KR20020046507 申请日期 2002.08.07
申请人 FUJIMI INCORPORATED 发明人 INA KATSUYOSHI;OHNO KOJI;SAKAI KENJI
分类号 B24B37/00;C09G1/02;C09K3/14;C23F3/06;H01L21/304;H01L21/321;(IPC1-7):C09K3/14 主分类号 B24B37/00
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