发明名称 |
METHOD FOR FORMING CONTACT HOLE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a contact hole of semiconductor devices is provided to simplify manufacturing processes by omitting a cleaning process to remove an oxide layer formed in the contact hole. CONSTITUTION: A first conductive layer for bit line is formed on a substrate(200). A second conductive layer made of TiN having a different etching selectivity compared to the first conductive layer is deposited by a PVD(Physical Vapor Deposition). After forming a TEOS pattern on the second conductive layer, a second conductive pattern is formed by using the TEOS pattern as a mask. A bit line(202a) is formed by selectively etching the first conductive layer using the second conductive pattern as a mask. After forming an interlayer dielectric(210) on the resultant structure, a contact hole is formed to expose the second conductive pattern by selectively etching the interlayer dielectric(210).
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申请公布号 |
KR20020091679(A) |
申请公布日期 |
2002.12.06 |
申请号 |
KR20010030548 |
申请日期 |
2001.05.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
EUN, BYEONG SU;YOON, JONG YUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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