发明名称 METHOD FOR FORMING CONTACT HOLE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a contact hole of semiconductor devices is provided to simplify manufacturing processes by omitting a cleaning process to remove an oxide layer formed in the contact hole. CONSTITUTION: A first conductive layer for bit line is formed on a substrate(200). A second conductive layer made of TiN having a different etching selectivity compared to the first conductive layer is deposited by a PVD(Physical Vapor Deposition). After forming a TEOS pattern on the second conductive layer, a second conductive pattern is formed by using the TEOS pattern as a mask. A bit line(202a) is formed by selectively etching the first conductive layer using the second conductive pattern as a mask. After forming an interlayer dielectric(210) on the resultant structure, a contact hole is formed to expose the second conductive pattern by selectively etching the interlayer dielectric(210).
申请公布号 KR20020091679(A) 申请公布日期 2002.12.06
申请号 KR20010030548 申请日期 2001.05.31
申请人 HYNIX SEMICONDUCTOR INC. 发明人 EUN, BYEONG SU;YOON, JONG YUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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