| 摘要 |
PURPOSE: A jig of an automatic classification apparatus for testing an integrated circuit(IC) is provided, which opens a latching device of an insert when using a pressing device to make a lead line contact a test board by pressing the IC. CONSTITUTION: An insert(10) comprises a depressed space defined by two facing surfaces and a bottom surface to accommodate an IC where a plurality of lead lines are arranged, and the depressed space comprises at least two slots formed on the bottom surface for the lead lines to pass through it. Two latching devices(24) can be shrunk elastically from two facing surfaces of the depressed space to locate the IC safely. A portable plate is combined with the latching devices to control the latching devices to be shrunk from the depressed space and is arranged on the insert. Pressing devices(40) comprise a block arranged on the bottom of a base part to press the lead lines of the IC passing through the slot. And at least two pressing rods(60) are provided near the block on the bottom of the base part of the pressing device for the latching device to be shrunk into the insert from the depressed space. |
