| 摘要 |
PROBLEM TO BE SOLVED: To reduce costs for testing by carrying out a performance test at a high speed when data are serially transmitted to/from the outside, and are transmitted in parallel for reading/writing them from/in memory cells. SOLUTION: This semiconductor integrated circuit is comprised of an input converter part 42 for converting serial data supplied externally into parallel data, plural memory cell areas 16a, 16b for writing each parallel data therein, and an output converter part 44 for converting the parallel data generated from the data read out of each memory cell 16a, 16b into serial data. In this case, the circuit is provided with an arithmetic part 56 for logically operating the parallel data read of each memory cell 16a, 16b on the rest mode.
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