发明名称 Method for automatic diagnosis of malfunctions
摘要 PCT No. PCT/DE95/00419 Sec. 371 Date Sep. 30, 1996 Sec. 102(e) Date Sep. 20, 1996 PCT Filed Mar. 28, 1995 PCT Pub. No. WO95/27236 PCT Pub. Date Oct. 12, 1995In the case of processor or installations, or both, which are monitored by sequence control from a PLC program which is produced as a contact plan (KOP), as a function plan (FUP) or as an instruction list (AWL), the AWL code of the PLC program is analyzed by machine and is prepared in the form of a knowledge base, according to the invention, in order to prepare for diagnosis. Step chain analysis and/or a transition analysis are/is carried out in order to prepare the knowledge base.
申请公布号 US5926621(A) 申请公布日期 1999.07.20
申请号 US19960718493 申请日期 1996.09.30
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SCHWARZ, PETER;BUNGERT, ULRICH;KRAEMER, ROLF
分类号 G05B19/05;(IPC1-7):G06F11/00 主分类号 G05B19/05
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