| 摘要 |
<p>In an interferometer system, variations of the refractive index in the medium traversed by the measuring beam (123) can be detected by using two measuring beams (123, 125) having wavelengths which differ by a factor of three. For this choice of the wavelength ratio, the interference filters of the polarization elements, such as the beam splitter (127), the μ/4 plates (130, 131) and the antireflection coatings can be manufactured relatively easily, and the detection accuracy is increased.</p> |
