发明名称 Flaw detection apparatus
摘要 A flaw detection apparatus detects a flaw formed on an object's surface based on a digital image data indicative of said object's surface as a group of plural pixels utilizing the image processing technique. An image processor is provided for detecting a direction in which each of group extends to combine a plurality of groups extending in substantially the same direction. The image processor further produces a flaw signal indicating sizes of thus combined groups.
申请公布号 US5850468(A) 申请公布日期 1998.12.15
申请号 US19980008211 申请日期 1998.01.16
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 YOKOYAMA, HARUHIKO;KOBAYASHI, AKIRA
分类号 G06T7/00;G06T7/60;(IPC1-7):G06K9/00 主分类号 G06T7/00
代理机构 代理人
主权项
地址