发明名称 ANALYTICAL SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an analytical system capable of automatically inspecting an specimen in an analytical system in which different specimen vessels exist mixedly. SOLUTION: Specimen vessels 10 received in a rack 20 are carried by a carrying line 130. An analytical unit 150 having a fractional mechanism 152 and an analytical unit 160 having a fractional mechanism 162 are arranged along the carrying line 130. A specimen vessel shape discriminating part 146 discriminates the shape of the specimen vessel, a control part 120 selects the fractional mechanism 152, 162 according to the inspected body, and hence the specimen sample is fractioned.
申请公布号 JPH1096734(A) 申请公布日期 1998.04.14
申请号 JP19960251469 申请日期 1996.09.24
申请人 HITACHI LTD 发明人 SAKAZUME TAKU;MIMAKI HIROSHI;MIMURA TOMONORI;KAWASE KAZUMITSU
分类号 G01N35/00;G01N35/02;G01N35/04;G01N35/10;(IPC1-7):G01N35/10 主分类号 G01N35/00
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