DEFORMATION-MEASURING DEVICE,申请号SU19864048977-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	DEFORMATION-MEASURING DEVICE
摘要
申请公布号	SU1406450(A1)	申请公布日期	1988.06.30
申请号	SU19864048977	申请日期	1986.04.03
申请人	INST ELEKTRODINAMIKI AN USSR;SP KT BYURO I ELEKTRODINAMIKI AN USSR	发明人	EVTUSHENKO IGOR A,SU;OLENIN NIKOLAJ N,SU;YANTSOV ALEKSANDR A,SU
分类号	G01B7/16;G01L1/22	主分类号	G01B7/16
代理机构		代理人
主权项
地址

您可能感兴趣的专利

COMMUNICATIONS APPARATUS

LAMINATED STRUCTURE DISTRIBUTED CONSTANT RC ELEMENT, NOTCH FILTER, AND ELECTRONIC EQUIPMENT

NETWORK CONNECTION METHOD AND SYSTEM THEREOF, AND PROGRAM FOR NETWORK CONNECTION

RADIO COMMUNICATION APPARATUS AND METHOD OF ESTIMATING THE NUMBER OF ANTENNAS

IMAGE PROCESSING APPARATUS

PACKET TRANSMISSION METHOD AND PACKET TRANSMISSION SYSTEM

DATA RECORDING/REPRODUCING METHOD AND RECORDING/REPRODUCING DEVICE

IMAGE DISPLAY APPARATUS

PIPELINED ANALOG/DIGITAL CONVERTER

IMAGING DEVICE AND ITS CONTROL METHOD

DATA BROADCAST RECEIVER

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR SYSTEM EMPLOYING IT

METHOD FOR MANUFACTURING TWO-DIMENSIONAL IMAGE DETECTOR

METHOD FOR COMPACT MICRO CHANNEL LAMINATED HEAT EXCHANGE, AND ITS SYSTEM

CMOS IMAGE SENSOR AND MANUFACTURING METHOD THEREFOR

SOLID-STATE IMAGING ELEMENT AND MANUFACTURING METHOD OF THE SOLID-STATE IMAGING ELEMENT

SEMICONDUCTOR DEVICE

EVALUATION APPARATUS OF SEMICONDUCTOR WAFER

ELECTRONIC APPARATUS